New ways of polymeric ion track characterization

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dc.contributor.authorFink, D
dc.contributor.authorMuller, M
dc.contributor.authorGhosh, S
dc.contributor.authorDwivedi, K K
dc.contributor.authorVacik, J
dc.contributor.authorHnatowicz, V
dc.contributor.authorCervene, J
dc.contributor.authorKobayashi, Y
dc.contributor.authorHirata, K
dc.date.accessioned2010-08-17T08:21:29Z
dc.date.available2010-08-17T08:21:29Z
dc.date.issued2010-08-17T08:21:29Z
dc.document.departmentChemistryen_US
dc.document.sourceNuclear Instruments and Methods in Physics Research Ben_US
dc.document.yearofpublication1990en_US
dc.identifier.urihttps://dspace.nehu.ac.in/handle/1/2737
dc.journal.pagerange170-176en_US
dc.journal.volume156en_US
dc.language.isoenen_US
dc.subjectPolymersen_US
dc.subjectIon tracken_US
dc.subjectTracersen_US
dc.subjectDepth profilesen_US
dc.subjectNeutron depth profilingen_US
dc.subjectPositron annihilation spectroscopyen_US
dc.subjectTomographyen_US
dc.subjectDiffusionen_US
dc.subjectSimulationen_US
dc.subjectSwellingen_US
dc.subjectFree volumeen_US
dc.subjectEtchingen_US
dc.submitter.addressNEHU, SHILLONG.en_US
dc.titleNew ways of polymeric ion track characterizationen_US
dc.typeArticleen_US
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