Impact of electrons irradiation on particle track etching response in polyallyl diglycol carbonate (PADC).
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2010-02-04T16:38:57Z
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2 MeV electrons; 140 MeV 28Si; PADC; Dose-dependent track registration properties; bulk etch-rate; etching response; critical angle of etching; detection efficiency; scanning electrons microcopy., 2 MeV electrons; 140 MeV 28Si; PADC; Dose-dependent track registration properties; bulk etch-rate; etching response; critical angle of etching; detection efficiency; scanning electrons microcopy.