Modification in Etching characteristics and Surface topography of some electrons irradiated polymers.

Date
2010-02-04T15:23:13Z
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Activation energy of etching; Bulk etch-rate; Atomic force microscopy; Surfacs roughness., Activation energy of etching; Bulk etch-rate; Atomic force microscopy; Surfacs roughness.
Citation
Collections