A track technique for the measurement of target thickness using heavy ions

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dc.contributor.authorDwivedi, K K
dc.contributor.authorGhosh, S
dc.contributor.authorRaju, J
dc.date.accessioned2010-08-18T06:18:20Z
dc.date.available2010-08-18T06:18:20Z
dc.date.issued2010-08-18T06:18:20Z
dc.document.departmentDepartment of Chemistryen_US
dc.document.sourceRadiation Measurementsen_US
dc.document.yearofpublication1995en_US
dc.identifier.urihttps://dspace.nehu.ac.in/handle/1/2766
dc.journal.pagerange183-185en_US
dc.journal.volume24 (2)en_US
dc.language.isoenen_US
dc.subjectTrack techniqueen_US
dc.subjectTarget thicknessen_US
dc.subjectHeavy ionsen_US
dc.submitter.addressNEHU, SHILLONG 793022en_US
dc.titleA track technique for the measurement of target thickness using heavy ionsen_US
dc.typeArticleen_US
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