On the critical etching parameters of track detectors

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dc.contributor.authorDwivedi, K K
dc.date.accessioned2010-03-23T11:45:26Z
dc.date.available2010-03-23T11:45:26Z
dc.date.issued2010-03-23T11:45:26Z
dc.document.departmentChemistryen_US
dc.document.sourceRadiation Measurementsen_US
dc.document.yearofpublication1997en_US
dc.identifier.urihttps://dspace.nehu.ac.in/handle/1/1360
dc.journal.pagerange453-456en_US
dc.journal.volume27 (3)en_US
dc.language.isoenen_US
dc.subjectEtching parametersen_US
dc.subjectTrack detectorsen_US
dc.submitter.addressNEHU, SHILLONG.en_US
dc.titleOn the critical etching parameters of track detectorsen_US
dc.typeArticleen_US
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