Etchable track lengths of 3.56 GeV 208Pb in various dielectric solids
dc.contributor.author | Ghosh, S | |
dc.contributor.author | Raju, J | |
dc.contributor.author | Dwivedi, K K | |
dc.date.accessioned | 2010-07-05T20:02:36Z | |
dc.date.available | 2010-07-05T20:02:36Z | |
dc.date.issued | 2010-07-05T20:02:36Z | |
dc.document.department | Department of Chemistry | en_US |
dc.document.source | Radiation Measurements | en_US |
dc.document.yearofpublication | 1995 | en_US |
dc.identifier.uri | https://dspace.nehu.ac.in/handle/1/2432 | |
dc.journal.pagerange | 171-176 | en_US |
dc.journal.volume | 24 (2) | en_US |
dc.language.iso | en | en_US |
dc.subject | Etchable track | en_US |
dc.subject | 3.56 GeV 208Pb | en_US |
dc.subject | Dielectric solids | en_US |
dc.submitter.address | NEHU, SHILLONG 793022 | en_US |
dc.title | Etchable track lengths of 3.56 GeV 208Pb in various dielectric solids | en_US |
dc.type | Article | en_US |