An external-beam charged-particle (alpha) activation system for direct trace element analysis in liquids
dc.contributor.author | Rao, V Raghunatha | |
dc.contributor.author | Khathing, D T | |
dc.contributor.author | Chowdhury, D P | |
dc.contributor.author | Gangadharan, S | |
dc.date.accessioned | 2010-05-06T13:42:57Z | |
dc.date.available | 2010-05-06T13:42:57Z | |
dc.date.issued | 2010-05-06T13:42:57Z | |
dc.document.department | Department of Physics | en_US |
dc.document.source | Meas Sci Techno | en_US |
dc.document.yearofpublication | 1991 | en_US |
dc.identifier.uri | https://dspace.nehu.ac.in/handle/1/2025 | |
dc.journal.pagerange | 610-615 | en_US |
dc.journal.volume | 2 | en_US |
dc.language.iso | en | en_US |
dc.subject | External-beam charged-particle | en_US |
dc.subject | Alpha activation system | en_US |
dc.subject | Trace element analysis | en_US |
dc.submitter.address | NEHU, SHILLONG 793022 | en_US |
dc.title | An external-beam charged-particle (alpha) activation system for direct trace element analysis in liquids | en_US |
dc.type | Article | en_US |